High precision measurement of anilox rollers

Starnberg, Germany-based Sibress has now taken over the distribution of the Veritas measurement microscope from MicroDynamics, USA, in addition to the products it has developed itself. The corresponding distribution agreement was concluded for the whole of Europe, as well as neighbouring countries.

The technological speciality of the completely newly developed system lies in its range of applications and precision. White light interferometry is used to determine the measurement results. This method uses the interference of a broadband light as a reference for scanning the object. The robustness and mechanical precision of the optical microscope system allow a resolution of up to 0.25 ┬Ám.

Nikon’s 10x and 20x microscope objectives, which have been completely redesigned for the system, cover the line count range between 25 and 800 L/cm. Particular attention was paid to a user-friendly user interface in the new development. The intuitive user guidance of the software enables the user to analyse the anilox surface without prior knowledge.

After setting up the Veritas microscope, the typical time from scan start to the evaluation of all acquired data, including 3D image, is less than 10 secs. Focusing the surface once enables the focus to be found automatically during further measurements. In the evaluation, all relevant data, such as cell depth, volume, angle, surface texture/roughness, wall thickness, opening angle and much more, is displayed.

The measurement results are logged just as easily afterwards. After the evaluation, the measured values as well as the 3D image of the measurement are available in the log for storage or printing. In this way, individual measurements can be carried out or two measurements can be compared with the integrated deviation analysis. Furthermore, logs can be created in a database and thus measurement results from different periods can be compared. This makes it possible to quickly determine whether the anilox rollers are still suitable for use.

 

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